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    Parametric Testing

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    FS-Pro

    All-In-One Semiconductor Parameter Analyzer

    Parameter Testing Reliability Testing Fast Pulse Measurement

    FS-Pro is an All-In-One Semiconductor Parameter Analyzer, effectively integrating high precision IV, CV, pulse IV, transient IV sampling, arbitrary linear waveform generation and measurement, high-speed time-domain signal acquisition and low-frequency noise test capability in a compact machine. 

    • Applies in almost all low frequency device characteristics measurement

    • Supports multi-channel parallel testing

    • Adopts PXI modular architecture to ensure compact size and  extensibility

    • Built-in professional testing software LabExpress with rich test presets and powerful functions for typical parameters test, reliability test

    • Wide applications for semiconductor devices, LED materials, two-dimensional materials, nano-materials, and novel devices

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    Highlights

    • All-In-One

      Supporting high precision IV, CV,
      pulse IV, transient IV sampling
      and 1/f noise test

    • Powerful

      Wide range and high precision
      high-speed sampling time-domain signal acquisition
      arbitrary linear waveform generation

    • Widely Adopted

      Over 100 customers worldwide
      including top design companies, foundries, IDMs, universities, and research institutions

    • Modular Architecture

      Enabling test configuration
      flexibility & extensibility

    • Easy-to-Use

      Build-in LabExpress software
      intuitive GUI for powerful measurement & analysis

    • SMU

      Seamlessly integrated with
      981X system & NoiseProPlus software

    Applications

    • Process development
      & device parameter testing

    • Semiconductor device
      reliability
      test

    • Semiconductor device
      ultrashort pulse
      testing

    • Non-destructive measurement
      & inspection

    • Opto-electronic device
      & MEMS measurement

    • 2D materials
      device testing

    • Metal
      testing

    • Advanced materials
      and device testing

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